Integrated circuit contacts having resistive electromigration ch

Details Integrated circuit contacts having resistive electromigration ch Integrated circuit contacts having resistive electromigration ch

1997-02-25

1998-06-02

Whitehead, Carl W.

Active solid-state devices (e.g., transistors, solid-state diode

Combined with electrical contact or lead

Of specified material other than unalloyed aluminum

257758, 257759, H01L 2348, H01L 2940

Patent

active

057604770

ABSTRACT:
An integrated circuit structure, such as a stackable integrated circuit chip, having at least one face. The structure comprises at least one elongate conductor running therein and terminating in a contact section having an exposed end at the at least at one face of the structure. At least one face conductor forms an electrical interface with the exposed end of the contact section. Means for limiting electromigration about the electrical interface, such as a contact section of the conductor having a cross-sectional area greater then a nominal-sectional area of the conductor, are disclosed.

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