Method for verifying electrically programmable non-volatile memo

Static information storage and retrieval – Floating gate – Particular biasing

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3651852, G11C 1606

Patent

active

058645039

ABSTRACT:
A method for verifying an electrically programmable non-volatile memory cell of an electrically programmable memory device after programming, providing for accessing the memory cell after having submitted the same to at least a programming pulse by means of a sensing circuit, checking an output of the sensing circuit, and submitting said memory cell to further programming pulses if said output of the sensing circuit corresponds to a non-programmed memory cell. The checking an output of the sensing circuit is performed at a first instant of time which is anticipated of a prescribed time interval with respect to a second instant of time at which said output of the sensing circuit is checked in a normal read operation of the memory device, said prescribed time interval corresponding to a prescribed security margin of programming of the memory cell. (FIGS. 2 and 4).

REFERENCES:
patent: 5396467 (1995-03-01), Liu
patent: 5524094 (1996-06-01), Nobukata
patent: 5559737 (1996-09-01), Tanaka

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