Connector contact contamination probe

Details Connector contact contamination probe Connector contact contamination probe

1978-10-12

1980-08-19

Tokar, Michael J.

Electricity: measuring and testing

Electromechanical switching device

Relay

G01R 3102

Patent

active

042186536

ABSTRACT:
Probe apparatus having a pair of folded electrodes is arranged for use in detecting and measuring contamination films and foreign material appearing on connector contact terminals. The probe apparatus (1) comprises an insulation support member (2) positioned between two dielectric elements (31, 41) each having a surface plated with electrically conducting elements (32, 42) joined at one end of the insulation member to form a folded electrode (33, 43) and left free at the other end to form two lead-in terminals (34, 35, 44, 45). The combined insulator support member and dielectric contact elements are mounted in a test head assembly so that operation of the test head assembly inserts the probe apparatus into a connector contact terminal to engage the two folded electrodes with the connector contact terminal. Electrical resistance measuring equipment coupled to the lead-in terminals measures the electrical resistance of contamination films and foreign material appearing on the connector contact terminal between the pair of folded electrodes.

REFERENCES:
patent: 3335365 (1967-08-01), Libhart
patent: 3735254 (1973-05-01), Severin
patent: 3974443 (1976-08-01), Thomas
patent: 3996514 (1976-12-01), Brown
patent: 4126824 (1978-11-01), Thornburg
J. Arnhart, R. Bove, IBM Technical Disclosure Bul. vol. 19, No. 12, pp. 4679, 4680.

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