Patent
1989-05-26
1990-12-18
James, Andrew J.
357 4, 357 2, 357 234, H01L 2978
Patent
active
049790064
ABSTRACT:
A reverse staggered type silicon thin film transistor includes a substrate having a gate electrode; a gate insulating layer on the substrate and the gate electrode, the gate insulating layer having a transistor-forming portion; a lower layer silicon film on the transistor-forming portion of the gate insulating layer and in contact therewith, the lower layer silicon film being formed at a first temperature and with a first thickness; an upper layer silicon film formed on the transistor-forming portion of the gate insulating layer at a second temperature which is lower than the first temperature and with a second thickness greater than the first thickness; and n-type silicon layer on the upper layer silicon film and in contact therewith; a source electrode on the n-type silicon layer; and a drain electrode on the n-type silicon layer.
REFERENCES:
patent: 4746961 (1988-05-01), Konishi et al.
Ogiwara Yoshihisa
Shirai Katsuo
Tanaka Sakae
Watanabe Yoshiaki
James Andrew J.
Monin Donald L.
Nippon Precision Circuits Ltd.
Seikosha Co. Ltd.
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