Plasma anodization system

Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering

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Details

204164, 204192R, 118 501, 118723, 156345, C23C 1400

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active

045855412

ABSTRACT:
A cusp field is applied between a plasma source of a vacuum chamber of a plasma anodization system and a substance such as a semiconductor substrate or a metal plate to be oxidized so that the substance may not be adversely affected by the plasma. The temperature control can be conducted independently of the plasma generating condition because the substance to be treated is not adversely affected by the plasma in a direct manner.

REFERENCES:
patent: 4180450 (1979-12-01), Morrison
Physics & Chem. Dictionary (3rd Ed. 1971), p. 241.
Introduction to Plasma Physics, Chen, 1974, pp. 38-41.
Advances in Plasma Physics, Chen, vol. 4, (1971), pp. 79-83, 120-122.

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