Burn-in activity monitor

Electrical pulse counters – pulse dividers – or shift registers: c – Applications – Determining machine or apparatus operating time or...

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G07C 302

Patent

active

057712670

ABSTRACT:
According to the present invention, the invention relates to a semiconductor device having an activity monitor circuit formed thereon for monitoring the switching activity of signals generated by other circuits on the device during burn-in testing. In one embodiment, the activity monitor circuit includes means for detecting a present state of a signal; means for comparing the present state with a previous state of the signal; means for determining whether the state of the signal has switched a requisite number of times in a predetermined time period; and means for displaying the results of the determination.

REFERENCES:
patent: 5189314 (1993-02-01), Georgiou et al.
patent: 5250941 (1993-10-01), McGregor et al.
patent: 5481222 (1996-01-01), Utz

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