Arrangement enabling pin contact test of a semiconductor device

Details Arrangement enabling pin contact test of a semiconductor device Arrangement enabling pin contact test of a semiconductor device

1996-07-03

1998-06-23

Tran, Toan

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Amplitude control

327327, 327534, H03K 508

Patent

active

057709645

ABSTRACT:
A clamp circuit for clamping potential of an internal node electrically connected to an external terminal has its clamping function activated and inactivated selectively in accordance with a control signal generated by a control circuit in response to a forced monitor mode activating signal. An output portion of a substrate potential generating circuit generating a prescribed internal voltage is selectively connected to the internal node in response to a control signal generated from a second control circuit in response to the forced monitor mode activating signal. In a semiconductor device having the clamp circuit for absorbing surge current, pin contact test, external monitoring of an internal potential and external application of the internal potential can be realized.

REFERENCES:
patent: 5023476 (1991-06-01), Watanabe et al.
patent: 5119337 (1992-06-01), Shimisu et al.
patent: 5189316 (1993-02-01), Murakami et al.
patent: 5321653 (1994-06-01), Suh et al.
patent: 5400290 (1995-03-01), Suma et al.
patent: 5448199 (1995-09-01), Park
patent: 5467026 (1995-11-01), Arnold
patent: 5615158 (1997-03-01), Ochoa et al.
Fundamentals of MOS Digital Integrated Circuits, by John P. Uyemura, 1988, Chapter 10, p. 586.

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