Multiplexing electronic test probe

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324763, G01R 104

Patent

active

056296177

ABSTRACT:
An analog electronic test probe includes hundreds of inputs each connected to two amplifiers, each in a separate multiplexer stage on an integrated circuit. A programmer, responsive to a dial, shifts data through a shift register of latches each of which is connected to one of the amplifiers, activating the amplifier(s) connected to the selected input, thereby multiplexing it (them) to selected output(s). Similarly, the gain for each output may be selected. An outdisable circuit connected to the outputs of each multiplexer and the outputs of each IC chip causes each output to appear electrically as an open circuit when no input associated with the multiplexer or chip is selected. This permits any number of multiplexers and IC chips to be daisy-chained together.

REFERENCES:
patent: 5103557 (1992-04-01), Leedy
patent: 5418470 (1995-05-01), Dagostino et al.
Hewlett Packard; Oscilloscope Probes and Accessories; Technical Data; cover page, p. 17, and Index.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Multiplexing electronic test probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Multiplexing electronic test probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Multiplexing electronic test probe will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1387898

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.