Clock signal test circuit

Details Clock signal test circuit Clock signal test circuit

1984-03-30

1986-12-09

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 307269, G01R 1512, G01R 3108, H03K 513

Patent

active

046282530

ABSTRACT:
An integrated circuit which has serially connected clock drivers for generating sequential clock signals further includes test circuitry for testing for the occurence of the clock signals. The test circuitry includes a current source for each of the sequential clock signals each of which is enabled upon receiving its associated clock signal. Consequently, the current sources are sequentially enabled until a clock signal fails to occur at which time no more clock signals occur so that no more current sources are enabled. The current sources are connected to a probe pad which is accessible external to the integrated circuit. Test apparatus for detecting the enabled current sources can be connected to the integrated circuit at the probe pad.

REFERENCES:
patent: 3248563 (1966-04-01), Hung Chang Lin
P. T. Brown & G. R. Heinberg, "Checking Digital System Clock Pulses, Aug. 1968, vol. 11, No. 3.

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