Method for evaluating the performance of detectors in a computed

Details Method for evaluating the performance of detectors in a computed Method for evaluating the performance of detectors in a computed

1994-09-12

1995-12-05

Porta, David P.

X-ray or gamma ray systems or devices

Accessory

Testing or calibration

378 18, 378 19, G01D 1800

Patent

active

054736633

ABSTRACT:
An x-ray CT scanner is operated in a test mode to acquire attenuation projections using a phantom shaped to accentuate errors due to non-uniform detector response along the z-axis. Error values are calculated for detector elements and these error values are compared with preset limits to identify faulty or marginal detector elements.

REFERENCES:
patent: 4352020 (1982-09-01), Horiba et al.
patent: 4663772 (1987-05-01), Mattson et al.
patent: 4818943 (1989-04-01), Chandra
patent: 4873707 (1989-10-01), Robertson
patent: 4991189 (1991-02-01), Boomgaarden et al.
patent: 5301108 (1994-04-01), Hsieh

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