Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-07-26
1995-12-05
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, 327512, 437 8, G01R 3126, H01L 29743
Patent
active
054732603
ABSTRACT:
A method and a circuit arrangement having a device for measuring the depletion layer temperature of a GTO are specified. In this case, a measurement current (I.sub.M) is impressed in the gate circuit, and the voltage (U.sub.GR) between the cathode and gate is measured, with an applied measurement current (I.sub.M), after the transient turn-off processes have decayed. This voltage (U.sub.GR) is at this time dependent on the depletion layer temperature of the GTO. It thus becomes possible to measure the depletion layer temperature directly on the element, that is to say without circuitous routes via a heat sink temperature and calculation of the thermal resistance or the like, and during operation, continuously, and in consequence to monitor and control the stress level on the GTO precisely.
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IEC Standardization Proposal 747-6 dated 1983, pp. 165-171.
Clemens Heumann et al., "Thyristoren Eigenschaften und Anwendungen", B. G. Teubner Stuttgart, 2. Aufl., 1970, pp. 23-29.
Hauswirth Christian
Hochstuhl Gerhard
Hofstetter Bruno
Keller Markus
ABB Management AG
Do Diep
Wieder Kenneth A.
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