Integrated logic circuit adapted to performance tests

Details Integrated logic circuit adapted to performance tests Integrated logic circuit adapted to performance tests

1980-03-17

1982-12-28

Miller, Stanley D.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307445, 307471, 307303, 324158R, 371 15, H03K 2100, H03K 1920

Patent

active

043663931

ABSTRACT:
An easily testable integrated logic circuit utilizes a plurality of flip-flops to form a feedback shift register. In some embodiments, means are provided for selectively forming the flip-flops into a feedback shift register and for selectively supplying either the flip-flop contents or a random signal as partial inputs to the combinational logic circuit. In other embodiments, the feedback shift register is coupled to the AND logic array outputs of a combinational circuit which also includes an OR logic array.

REFERENCES:
patent: 3651315 (1972-03-01), Collins
patent: 3924144 (1975-12-01), Hadamand
patent: 3958110 (1976-05-01), Hong et al.
patent: 4139318 (1979-02-01), Schneider
patent: 4213007 (1980-07-01), Funk

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