System for measuring characteristics of electron emitting source

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324158D, 324411, G01R 2900, G01R 3126

Patent

active

048946117

ABSTRACT:
A measuring system particularly suitably usable with an apparatus having a plurality of electron emitting sources, for measuring the characteristics of the electron emitting sources is disclosed. In the measuring system, the electron emitting sources are driven so that they emit electron flows of predetermined and different frequencies. The emitted electron flows are collected and, thereafter, only those signals having components corresponding to the predetermined frequencies are extracted. Based on the extracted signals, the characteristics of the electron emitting sources are measured at the same time and independently of each other.

REFERENCES:
patent: 1406996 (1922-02-01), Morrill
patent: 2782366 (1957-02-01), Wall
patent: 3324395 (1967-06-01), Springer
patent: 4259678 (1981-03-01), van Gorkom et al.
patent: 4325084 (1982-04-01), van Gorkom et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System for measuring characteristics of electron emitting source does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for measuring characteristics of electron emitting source, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for measuring characteristics of electron emitting source will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1337203

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.