Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent
1998-09-03
2000-07-25
Powell, William
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
438753, 438756, H01L 2100
Patent
active
060936525
ABSTRACT:
In one aspect, the invention includes a method of forming an insulative plug within a substrate, comprising: a) forming a masking layer over the substrate, the masking layer having an opening extending therethrough to expose a portion of the underlying substrate; b) etching the exposed portion of the underlying substrate to form an opening extending into the substrate; c) forming an insulative material within the opening in the substrate, the insulative material within the opening forming an insulative plug within the substrate; d) after forming the insulative material within the opening, removing the masking layer; and e) after removing the masking layer, removing a portion of the substrate to lower an upper surface of the substrate relative to the insulative plug.
REFERENCES:
patent: 5244534 (1993-09-01), Yu et al.
patent: 5272117 (1993-12-01), Roth et al.
patent: 5858858 (1999-01-01), Park et al.
Lee Whonchee
Pan Pai-Hung
Micro)n Technology, Inc.
Powell William
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