Image analysis – Pattern recognition – Feature extraction
Patent
1996-09-03
1999-03-09
Johns, Andrew W.
Image analysis
Pattern recognition
Feature extraction
382203, G06K 946
Patent
active
058811710
ABSTRACT:
A method of extracting a specific configuration including: measuring a density or luminance of portions of an image; determining a change in density or luminance for each direction at each portion of the image. Based on the results of the measurement, setting a reference point corresponding to a portion whose amount of change along a predetermined direction of the image is greater than or equal to a predetermined value; setting a search range, corresponding to a distance from the reference point which is within an angle range with respect to the reference point. The angle range is determined in accordance with a contour configuration of the region based on a direction determined in advance or a direction in change in density or luminance at the reference point which is greater than or equal to a predetermined value; and setting a search direction pattern in the search range which expresses a direction in which the density or luminance changes, and searching for portions which exist within the search range and whose amount of change in density or luminance along a direction expressed by the search direction is greater than or equal to a predetermined value; and when a portion which satisfies a search condition is detected, repeating setting of a detected portion as a next reference point; and extracting the line formed by connecting a plurality of reference points as the contour line.
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Fuji Photo Film Co. , Ltd.
Johns Andrew W.
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