Radiation imagery chemistry: process – composition – or product th – Diazo reproduction – process – composition – or product – Composition or product which contains radiation sensitive...
Patent
1993-02-25
1995-06-13
Bowers, Jr., Charles L.
Radiation imagery chemistry: process, composition, or product th
Diazo reproduction, process, composition, or product
Composition or product which contains radiation sensitive...
430165, 430192, 430193, G03F 7023
Patent
active
054241677
ABSTRACT:
A positive type resist composition comprising an alkali-soluble novolac resin, a quinonediazide compound and a compound represented by general formula (I): ##STR1## wherein Y.sub.1 to Y.sub.10 each represent a hydrogen atom, a hydroxyl group or an alkyl group, provided that at least one of Y.sub.1 to Y.sub.10 is a hydroxyl group, and X represents one of the groups represented by the following formulas: ##STR2## wherein R.sub.1 to R.sub.3 independently of one another each represent a hydrogen atom or an alkyl group, provided that, as measured by GPC, the pattern area of the component having a molecular weight, converted to polystyrene, 1,000 or below in the alkali-soluble novolac resin is 25% or less based on the total pattern area of the novolac resin from which the pattern area of the unreacted phenol compound is excepted. This positive type resist composition is excellent in the balance between performances such as sensitivity, resolution, heat resistance and adhesive property.
REFERENCES:
patent: 3188210 (1965-06-01), Fritz et al.
patent: 4387152 (1983-06-01), Stahlhofen
patent: 4404272 (1983-09-01), Stahlhofen
Kajita et al. Chemical Abstracts, vol. 117, No. 10, 1992, abstract No. 102439b.
Chemical Abstracts, vol. 97, No. 22, 1982, abstract No. 191249y.
Moriuma Hiroshi
Uetani Yasunori
Bowers Jr. Charles L.
Sumitomo Chemical Co,. Ltd.
Young Christopher G.
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