Optical potential field mapping system

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

359292, 382195, 382206, 395 93, 395 94, G02B 2764

Patent

active

054831687

ABSTRACT:
The present invention relates to an optical system for creating a potential field map of a bounded two dimensional region containing a goal location and an arbitrary number of obstacles. The potential field mapping system has an imaging device and a processor. Two image writing modes are used by the imaging device, electron deposition and electron depletion. Patterns written in electron deposition mode appear black and expand. Patterns written in electron depletion mode are sharp and appear white. The generated image represents a robot's workspace. The imaging device under processor control then writes a goal location in the workspace using the electron deposition mode. The black image of the goal expands in the workspace. The processor stores the generated images, and uses them to generate a feedback pattern. The feedback pattern is written in the workspace by the imaging device in the electron deposition mode to enhance the expansion of the original goal pattern. After the feedback pattern is written, an obstacle pattern is written by the imaging device in the electron depletion mode to represent the obstacles in the robot's workspace. The processor compares a stored image to a previously stored image to determine a change therebetween. When no change occurs, the processor averages the stored images to produce the potential field map.

REFERENCES:
patent: 4958914 (1990-09-01), Owechko et al.
patent: 5020114 (1991-05-01), Fujioka et al.
patent: 5208750 (1993-05-01), Kurami et al.
patent: 5241481 (1993-08-01), Olsen
Latombe, Jean-Claude, "Chapter 7--Potential Field Methods," Robot Motion Planning, Kluwer Academic Publishers, Mass. (no month) (1991) pp. 295-341.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Optical potential field mapping system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Optical potential field mapping system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical potential field mapping system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1304851

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.