Optics: measuring and testing – Of light reflection – By comparison
Patent
1983-11-10
1986-01-28
McGraw, Vincent P.
Optics: measuring and testing
Of light reflection
By comparison
356243, G01N 2155, G01J 102
Patent
active
045667985
ABSTRACT:
A method is disclosed for calibrating a reflectometer using black and white references observed in locations optically different from the sample location. Dark and light standards are selected to have reflectance values, while examined in the detection location of the test elements, that are within .+-.0.005 and .+-.0.05 of the values of the black and white references, respectively, when examined in a location displaced from the detection location of the test elements. Such standards are then read on a referee reflectometer having "ideal" black and white references, and the reflectances so read on the referee reflectometer are recorded for use as calibrating factors in making reflectance readings for the test elements.
REFERENCES:
patent: 3832070 (1974-08-01), Cox
patent: 3874799 (1975-04-01), Isaacs et al.
patent: 4029419 (1977-06-01), Schumann et al.
Hunter, Richard S., "A Multipurpose Photoelectric Reflectometer", National of Standards, J.O.S.A., vol. 30, Nov. 1940, pp. 536-559.
Par. 1-3 and 3-3 of the Owner's Manual for the "Reflection Densitometer Model RD-400 Quanta Log" manufactured by Macbeth Instrument Corp., Newburgh, N.Y., dated 1968.
Eastman Kodak Company
McGraw Vincent P.
Schmidt Dana M.
Thompson Robert
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