Programmable read only memory integrated circuit with bit-check

Details Programmable read only memory integrated circuit with bit-check Programmable read only memory integrated circuit with bit-check

1979-07-02

1981-11-17

Atkinson, Charles E.

Excavating

365185, 324211, G01R 3128

Patent

active

043015352

ABSTRACT:
A programmable read only memory (PROM) integrated circuit is constructed with two new operating modes: a bit-check mode and a deprogramming mode. In the bit-check mode, circuitry is provided to readily determine the apparent threshold voltage of each programmable transistor within the PROM. In the deprogrammable mode, circuitry is provided to simultaneously subject all programmable transistors within the PROM to a deprogramming stress. The bit-check mode provides a rapid programming method, and the bit-check mode and deprogramming mode are utilized in conjunction with each other to provide a rapid and thorough testing method.

REFERENCES:
patent: 3744036 (1973-07-01), Frohman-Bentchkowsky
patent: 3795859 (1974-03-01), Benante et al.
patent: 4061908 (1977-12-01), de Jonge et al.
patent: 4122544 (1978-10-01), McElroy
patent: 4161039 (1979-07-01), Rossler
patent: 4169291 (1979-09-01), Rossler
patent: 4172291 (1979-10-01), Owens et al.
patent: 4179626 (1979-12-01), Oehler
patent: 4181980 (1980-01-01), McCoy

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