Method and system for detecting elliptical objects

Image analysis – Histogram processing – For setting a threshold

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

382 18, 382 41, 382 22, G06K 946

Patent

active

046189890

ABSTRACT:
In order to define the contour of an ellipse, it is necessary to determine five unknown parameters in the general equation representative of centered conics. When directly applying Hough transformation method to the above equation, since a five-dimensional space is required, it is practically impossible to detect an ellipse because a long processing time and a great amount of memory capacity are inevitably required. To overcome these problems, the geometric properties of an ellipse are determined separately on three parameter sub-spaces obtained on the basis of edge vector field: two-dimensional center histogram and two-dimensional (H, B) histogram, one-dimensional C histogram. A peak value on the center histogram represents a group of ellipse having the same center locations; a peak value on the (H, B) histogram represents a group of concentric ellipse having the same eccentricity and axis slope; a peak value on the C histogram defines a single ellipse. By sequentially selecting these peaks in the three sub-spaces, it is possible to define geometric properties of an ellipse under practical processing conditions. In order to define a plurality of ellipses efficiently, several novel methods have been adopted: separation of the rotation directions of edge vector field, recovery of edge vectors having no mate edge vectors; adoption of least mean square method, etc., in particular.

REFERENCES:
patent: 3936800 (1976-02-01), Ejiri et al.
"Detection of Elipses by a Modified Hough Transform", by Tsuji and Matsumoto, IEEE Transactions on Computers, C 27-8, (1978).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for detecting elliptical objects does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for detecting elliptical objects, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for detecting elliptical objects will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1293584

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.