Method of forming opaque border on semiconductor photomask

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

430315, 205183, G03F 900

Patent

active

058043365

ABSTRACT:
The present invention provides a method of fabricating photomasks having a border region and a pattern region, which may be electrically isolated. The border region may include a nontransparent region, such as an opaque chrome layer. The pattern region may include a substantially nontransparent region, such as a leaky chrome layer. The methods of the present invention include placing the photomask in an electrochemical cell and electrically connecting a portion of the photomask to an electrode, and applying a potential, thereby electrochemically transferring a layer between the electrochemical cell and the photomask.

REFERENCES:
patent: 4451544 (1984-05-01), Kawabuchi
patent: 5578184 (1996-11-01), Imataki et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming opaque border on semiconductor photomask does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming opaque border on semiconductor photomask, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming opaque border on semiconductor photomask will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1280625

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.