Focal-surface detector for heavy ions

Details Focal-surface detector for heavy ions Focal-surface detector for heavy ions

1977-05-13

1979-04-17

Dixon, Harold A.

Radiant energy

Ionic separation or analysis

Methods

250385, B01D 5944

Patent

active

041502906

ABSTRACT:
A detector of the properties of individual charged particles in a beam includes a gridded ionization chamber, a cathode, a plurality of resistive-wire proportional counters, a plurality of anode sections, and means for controlling the composition and pressure of gas in the chamber. Signals generated in response to the passage of charged particles can be processed to identify the energy of the particles, their loss of energy per unit distance in an absorber, and their angle of incidence. In conjunction with a magnetic spectrograph, the signals can be used to identify particles and their state of charge. The detector is especially useful for analyzing beams of heavy ions, defined as ions of atomic mass greater than 10 atomic mass units.

REFERENCES:
patent: 2741709 (1956-04-01), Tirico et al.
patent: 3927324 (1975-12-01), Fletcher

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