Integrated Silicon profilometer and AFM head

Measuring and testing – Surface and cutting edge testing – Roughness

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

269 57, 310333, G01B 734

Patent

active

058615490

ABSTRACT:
A topographic head for profilometry and AFM supports a central paddle by coaxial torsion bars projecting inward from an outer frame. A tip projects from the paddle distal from the bars. The torsion bars include an integrated paddle rotation sensor. A XY stage may carry the topographic head for X and Y axis translation. The XYZ stage's fixed outer base is coupled to an X-axis stage via a plurality of flexures. The X-axis stage is coupled to a Y-axis stage also via a plurality of flexures. One of each set of flexures includes a shear stress sensor. A Z-axis stage may also be included to provide an integrated XYZ scanning stage. The topographic head's frame, bars and paddle, and the XYZ stage's stage-base, X-axis, Y-axis and Z-axis stages, and flexures are respectively monolithically fabricated by micromachining from a semiconductor wafer.

REFERENCES:
patent: 4317611 (1982-03-01), Petersen
patent: 4468282 (1984-08-01), Neukermans
patent: 4506154 (1985-03-01), Scire
patent: 4598585 (1986-07-01), Boxenhorn
patent: 4670092 (1987-06-01), Motamedi
patent: 4699006 (1987-10-01), Boxenhorn
patent: 4732440 (1988-03-01), Gadhok
patent: 4869107 (1989-09-01), Murakami
patent: 4942766 (1990-07-01), Greenwood et al.
patent: 5016072 (1991-05-01), Greiff
patent: 5051379 (1991-09-01), Bayer et al.
patent: 5111693 (1992-05-01), Grieff
patent: 5116462 (1992-05-01), Bartha et al.
patent: 5171992 (1992-12-01), Clabes et al.
patent: 5186041 (1993-02-01), Nyssonen
patent: 5201992 (1993-04-01), Marcus et al.
patent: 5202785 (1993-04-01), Nelson
patent: 5203208 (1993-04-01), Bernstein
patent: 5220835 (1993-06-01), Stephan
patent: 5251485 (1993-10-01), Kondo
patent: 5267471 (1993-12-01), Abraham et al.
patent: 5282924 (1994-02-01), Bayer et al.
patent: 5285142 (1994-02-01), Galburt et al.
patent: 5298975 (1994-03-01), Khoury et al.
patent: 5331852 (1994-07-01), Greiff et al.
patent: 5412980 (1995-05-01), Elings et al.
patent: 5488862 (1996-02-01), Neukermans et al..
patent: 5500535 (1996-03-01), Jing
patent: 5579148 (1996-11-01), Nishikawa et al.
patent: 5629790 (1997-05-01), Neukermans et al.
patent: 5641897 (1997-06-01), Schuman
Stephen A. Joyce, et al., A New Force Sensor Incorporating Force-Feedback Control for Interfacial Force Microscopy, Review of Scientific Instruments vo. 62, No. 3, Mar. 1991, pp. 710-715.
Boxenhorn, B., et al., "Monolithic Silicon Accelerometer," Sensors and Actuators, A21-A23 (1990) pp. 273-277.
Breng, U., et al., "Electrostatic Micromechanic Actuators," Journal of Micromechanics and Microengineering, 2 (1992) pp. 256-261.
Buser, R.A., et al., "Very High Q-factor Resonators in Monocrystalline Silicon," Sensors and Actuators, A21-A23 (1990) pp. 323-327.
Diem, B., et al., "SOI (SIMOX) as a Substrate For Surface Micromachining of Single Crystalline Silicon Sensors and Actuators," The 7th International Conference on Solid-State Sensors and Actuators, (1993) pp. 233-236.
Jaecklin, V.P., et al., "Mechanical and Optical Properties of Surface Micromachined Torsional Mirrors in Silicon, Polysilicon and Aluminum", The 7th International Conference on Solid-State Sensors and Actuators, (1993) pp. 958-961.
Kleiman, R.N., et al., "Single-Crystal Silicon High-Q Torsional Oscillators," Rev. Sci. Instum. 56(11), Nov. 1985, pp. 2088-2091.
Pfann, W.G., et al., "Semiconducting Stress Transducers Utilizing the Transverse and Shear Piezoresistance Effects," Journal of Applied Physics, vol. 32, No. 10, pp. 2008-2016 Oct. 1961.
Wagner, B., et al., "Electromagnetic Microactuators with Multiple Degrees of Freedom," 1991 International Conference on Solid-State Sensors and Actuators, Digest of Technical Papers. (IEEE Cat. No. 91CH2817-5) pp. 614-617.
Petersen, K., "Silicon Torsional Mirror," Proceedings of the IEEE vol. 70, No. 5, pp. 61-62, May 1982.
E. Clayton Teague, et al., Para-flex Stage for Microtopographic Mapping, Review of Scientific Instruments, vol. 59, No. 1, Jan. 1988, pp. 67-73.
J. E. Houston, et al., The Interfacial-force Microscope, Nature, vol. 356, 19, Mar. , 1992, pp. 266-267.
D. A. Grigg, et al., Rocking-Beam Force-Balance Approach to Atomic Force Microscopy, Ultramicroscopy 42-44, 1992, pp. 1504-1508.
M. G. L. Gustafsson, et al., Scanning Force Microscope Springs Optimized for Optical-Beam Deflection and With Tips Made by Controlled Fracture, Journal of Applied Physics, vol. 76, No. 1, 1, Jul. , 1994, pp. 172-181.
S. T. Smith, et al., Design and Assesment of Monolithic High Precision Translation Mechanism, Journal of Physics E: Scientific Instruments, vol. 20, 1987, pp. 977-983.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Integrated Silicon profilometer and AFM head does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated Silicon profilometer and AFM head, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated Silicon profilometer and AFM head will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1248010

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.