Temperature measurement with interleaved bi-level current on a d

Details Temperature measurement with interleaved bi-level current on a d Temperature measurement with interleaved bi-level current on a d

1997-06-30

1999-11-23

Tran, Toan

Miscellaneous active electrical nonlinear devices, circuits, and

External effect

Temperature

327403, H03K 342, H03K 1762

Patent

active

059907258

ABSTRACT:
Temperature measurement with interleaved bi-level current on a diode and bi-level current source therefor which provides a very accurate ratio of measurement currents through the diode without calibration and despite process and temperature variations. The bi-level current source uses a plurality N of individual current sources wherein the higher current is comprised of the sum of the N individual current sources and the lower current is comprised of one of the individual current sources, with a temperature measurement being made using N higher current/lower current measuring sequences and using a different one of the N individual current sources for each sequence. Proper selection of the value of N and proper ordering of the two currents in each of the N measuring sequences when the diode temperature is increasing or decreasing will provide an output temperature representing the temperature of the diode at the beginning of the N measurement sequences, at the end of the N measurement sequences, or half way between. Alternate methods of achieving the results of the invention are disclosed.

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