Liquid crystal cells – elements and systems – Particular structure – Having significant detail of cell structure only
Patent
1997-09-12
1999-03-30
Sikes, William L.
Liquid crystal cells, elements and systems
Particular structure
Having significant detail of cell structure only
349149, 257 59, 257 72, G02F 11345, H01L 2904
Patent
active
058895736
ABSTRACT:
The present invention concerns an active-matrix addressed TFT substrate using a thin film transistor, a manufacturing method and an anodic oxidation method thereof, a liquid crystal display panel using the TFT substrate and a liquid crystal display equipment using the liquid crystal display panel and, more in particular, it relates to a structure and a manufacturing method which enables to improve the characteristics thereof.
In the present invention, Cr or Ta is used for gate terminals, aluminum or a metal mainly composed of aluminum is used for gate bus-lines extended therefrom, gate electrodes and thin film capacitances (additional capacitance, storage capacitance) and an anodic oxidized film composed of the metal and free from defect is used for at least one of gate insulators, dielectric films of the thin film capacitances and interlayer insulation films for the intersections between the bus-lines. In a more preferred structure, the anodic oxidized film is used for all of the gate insulators, the dielectric films for the thin film capacitances and the interlayer insulation films for the intersections between the bus-lines.
The present invention also relates to a method of selectively forming an anodic oxidized film on an aluminum pattern. That is, in a case of forming a selective oxidation mask to a desired region on the aluminum pattern with a positive type photoresist, in the present invention, an angle (.theta.) formed between the selective oxidation mask and the aluminum pattern is made as: .theta..gtoreq.110-20T (T: film thickness of the positive type photoresist).
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Matsukawa Yuka
Matsumaru Haruo
Sasano Akira
Shirahashi Kazuo
Tanaka Yasuo
Hitachi , Ltd.
Nguyen Tiep H.
Sikes William L.
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