Thin film magnetometer using an orthogonal flux gate

Details Thin film magnetometer using an orthogonal flux gate Thin film magnetometer using an orthogonal flux gate

1974-06-14

1977-02-08

Corcoran, Robert J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

G01R 3304

Patent

active

040074170

ABSTRACT:
The orthogonal flux gate thin film magnetometer comprising an orthogonal flux gate utilizing a rotation magnetization mechanism consisting of a sensing coil wound on a plated wire formed by applying to a conductor a ferromagnetic thin film, an alternating excitation power means for exciting the thin film of the flux gate, an amplitude difference detection circuit means for detecting a difference between positive and negative asymmetrical peak values of the output voltage of the flux gate, and a control means for feedback of the output of the detection circuit to the sensing coil of the flux gate through a feedback circuit and for supplying the output of the control means to an indicating means. The magnitude and the polarity of the external magnetic field are sensed from the feedback current which erases the external magnetic field applied to the flux gate.

REFERENCES:
patent: 2543843 (1951-03-01), Frosch
patent: 2752564 (1956-06-01), Ryerson
patent: 2870270 (1959-01-01), Nagai et al.
patent: 2942180 (1960-06-01), Coker
patent: 3239754 (1966-03-01), Odom, Jr. et al.
patent: 3718872 (1973-02-01), Takeuchi
Oshima et al, High Sensitivity Plated-Wire Senor, AEEE Trans. on Mag., Sept. 1971, pp. 436-437.

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