Method for programming an ETOX EPROM or flash memory when cells

Static information storage and retrieval – Floating gate – Particular biasing

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

365168, 365184, 36518503, G11C 1300

Patent

active

055879497

ABSTRACT:
Multiple logic levels can be simultaneously programmed into any combination of memory cells in a column of an ETOX array by applying one of a corresponding number of programming voltages to the word lines that correspond with the cells to be programmed. In the present invention, the memory cells in the array form a punchthrough current during programming which, in turn, leads to the formation of an increased number of substrate hot electrons. By utilizing the substrate hot electrons formed from the punchthrough current in addition to the channel hot electrons, much lower control gate voltages can be utilized during programming.

REFERENCES:
patent: 4181980 (1980-01-01), McCoy
patent: 4279024 (1981-07-01), Schrenk
patent: 4357685 (1982-11-01), Daniele et al.
patent: 4698787 (1987-10-01), Mukherjee et al.
patent: 5021999 (1991-06-01), Kohda et al.
patent: 5043940 (1991-08-01), Harari
patent: 5187683 (1993-02-01), Gill
patent: 5204835 (1993-04-01), Eitan
patent: 5319593 (1994-06-01), Wolstenholme
patent: 5346842 (1994-09-01), Bergemont
patent: 5394362 (1995-02-01), Banks
patent: 5416738 (1995-05-01), Shrivastava
patent: 5418743 (1995-05-01), Tomioka et al.
patent: 5440505 (1995-08-01), Fazio et al.
patent: 5477485 (1995-12-01), Bergemont et al.
patent: 5511021 (1996-04-01), Bergemont et al.
T. Blyth et al., "A Non-Volatile Analog Storage Device Using EEPROM Technology", ISSCC91/Session 11/Emerging Circuit Technologies/Paper TP11.7, Feb. 14, 1991 (3 Pages).
M. Horiguchi et al., "An Experimental Large-Capacity Semiconductor File Memory Using 16-Levels/Cell Storage", IEEE Journal of Solid-State Circuits, vol. 23, No. 1, Feb. 1988, pp. 27-33.
C. Bleiker et al. "A Four-State EEPROM Using Floating-Gate Memory Cells", IEEE Journal of Solid-State Circuits, vol. SC-22, No. 3, Jun. 1987, pp. 460-463.
N. Saks et al., "Observation of Hot-Hole Injection of NMOS Transistors Using a Modified Floating-Gate Technique", U.S. Government Publication (5 pages).
K. Oyama et al., "A Novel Erasing Technology for 3.3V Flash Memory with 64Mb Capacity and Beyond", 1992 IEEE, IEDM 92, pp. 607-610.
S. Yamada et al., "A Self-Convergence Erasing Scheme for a Simple Stacked Gate Flash EEPROM", 1991 IEEE, IEDM 91, pp. 307-310.
E. Takeda et al., "Device Performance Degradation Due to Hot-Carrier Injection at Energies Below the Si-SiO.sub.2 Energy Barrier", 1983 IEEE, IEDM 83, pp. 396-399.
K. R. Hofmann et al., "Hot-Electron and Hole-Emission Effects in Short n-Channel MOSFET's", IEEE Transactions on Electron Devices, vol. ED-32, No. 3, Mar. 1985, pp. 691-699.
Y. Nissan-Cohen, "A Novel Floating-Gate Method for Measurement of Ultra-Low Hole and Electron Gate Currents in MOS Transistors", IEEE Electron Device Letters, vol. EDL-7, No. 10, Oct. 1986, pp. 561-563.
R. Bez et al., "A Novel Method for the Experimental Determination of the Coupling Ratios in Submicron EPROM and Flash EEPROM Cells", 1990 IEEE, IEDM 90, pp. 99-102.
Myrvaagnes, R., Will flash memory hold multiple bits/cell?, Outlook, Electronic Products, Sep. 1994, p. 20.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for programming an ETOX EPROM or flash memory when cells does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for programming an ETOX EPROM or flash memory when cells , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for programming an ETOX EPROM or flash memory when cells will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1183356

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.