Method for detecting and locating open-circuit defects within di

Details Method for detecting and locating open-circuit defects within di Method for detecting and locating open-circuit defects within di

1997-03-21

1999-10-05

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324537, G01R 3126

Patent

active

059630469

ABSTRACT:
A method of detecting open circuit defects within an integrated circuit. The invention includes locating a conductive plate proximate to a top surface of the integrated circuit. A voltage potential is coupled to the conductive plate. The voltage potential of the conductive plate couples to open circuit interconnections within the integrated circuit. Open circuit interconnections are identified by monitoring the quiescent current conducted by the integrated circuit while controlling the voltage on the conductive plate and controlling inputs to the integrated circuit.

REFERENCES:
patent: 5392293 (1995-02-01), Hsue
patent: 5670892 (1997-09-01), Sporck
patent: 5818239 (1998-10-01), Scaman

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