Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Patent
1997-07-21
1999-10-05
Rosasco, S.
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
G03F 900
Patent
active
059621729
ABSTRACT:
A method of manufacturing a photomask includes the steps of determining deviation quantities between positions of first and second resist patterns by comparison between the first and second resist patterns, calculating quantities for shifting mask pattern positions based on the deviation quantities between the resist pattern positions, respectively, calculating quantities for shifting drawing fields based on the quantities for shifting the mask pattern positions, respectively, and drawing predetermined mask patterns on a mask substrate in accordance with the quantities for shifting the drawing fields, respectively.
REFERENCES:
patent: 5468580 (1995-11-01), Tanaka
patent: 5773180 (1996-06-01), Tomimatu
Mitsubishi Denki & Kabushiki Kaisha
Rosasco S.
LandOfFree
Method and apparatus for manufacturing photomask and method of m does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for manufacturing photomask and method of m, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for manufacturing photomask and method of m will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1169650