Patent
1983-01-10
1986-11-25
Edlow, Martin H.
357 2, 357 4, 357 59, H01L 2978, H01L 2712, H01L 4902, H01L 2904
Patent
active
046252240
ABSTRACT:
A semiconductor element having a main part of a polycrystalline silicon semiconductor layer containing 0.01 to 5 atomic % of chlorine atoms.
REFERENCES:
patent: 4196438 (1980-04-01), Carlson
patent: 4239554 (1980-12-01), Yamazaki
patent: 4520380 (1985-05-01), Ovshinsky et al.
Kamins, "Hydrogenation of Transistors Fabricated in Polycrystalline-Silicon Films," IEEE Electron Device Letters, vol. EDL-1, No. 8, Aug. 1980.
Hirai Yutaka
Komatsu Toshiyuki
Nakagawa Katsumi
Nakagiri Takashi
Omata Satoshi
Canon Kabushiki Kaisha
Edlow Martin H.
Fallick E.
LandOfFree
Thin film transistor having polycrystalline silicon layer with 0 does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Thin film transistor having polycrystalline silicon layer with 0, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin film transistor having polycrystalline silicon layer with 0 will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1161052