Testing an integrated circuit containing a tristate driver and a

Details Testing an integrated circuit containing a tristate driver and a Testing an integrated circuit containing a tristate driver and a

1982-05-26

1984-12-25

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, G01R 3100, G01R 3126

Patent

active

044906730

ABSTRACT:
An integrated circuit chip includes a tristate driver which assumes an active logical state in response to a data signal at its data input and assumes a high impedance state in response to a control signal at its control input. The integrated circuit chip also includes a control signal generating network which is connected to the tristate driver's control input for producing the control signal. The control signal generating network may be tested by connecting the control signal generating network to the data input and overriding the control input to prevent the tristate driver from assuming the high impedance state. Thus, for testing purposes, the proper response of the control signal generating circuit may be ascertained by monitoring the active state of the tristate driver.

REFERENCES:
IBM Technical Disclosure Bulletin, vol. 23, No. 7A, Dec. 1980, Logic-Array Isolation for Testing, P. Goel, pp. 2794-2799.
IBM Technical Disclosure Bulletin, vol. 23, No. 1, Jun. 1980, Multiple Input Stage, K. Pollmann, R. Remshardt, H. Schettler & R. Zuehlke, pp. 207-208.
IBM Technical Disclosure Bulletin, vol. 23, No. 9, Feb.1981, Testing of Tristate Driver Circuits, H. D. Schnurmann, L. J. Vidunas, Jr. & C. Y. Wong, pp. 4156-4158.
IBM Technical Disclosure Bulletin, vol. 23, No. 8, Jan. 1981, Testing of Off-Chip Drivers in FET Designs, P. P. Puri & Y. K. Puri, pp. 3798-3799.

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