Integrated circuit testing device

Details Integrated circuit testing device Integrated circuit testing device

1991-11-22

1995-05-02

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Slope control of leading or trailing edge of rectangular or...

371 27, 327 1, 327306, 327108, 327538, H03K 301, H03K 513, H03L 500, G01R 3128

Patent

active

054122589

ABSTRACT:
An integrated circuit testing device, including a small test signal generator for generating a small test signal having a small amplitude corresponding to a test signal supplied to an input terminal of a target integrated circuit to be tested; a test signal supply circuit for amplifying the small test signal generated from the small test signal generator to obtain the test signal having a predetermined power and timing, and for supplying the test signal to the input terminal of the target integrated circuit to be tested; and a controller for setting a rise time of the test signal and a fall time of the test signal at a predetermined time by adjusting the amount of power of the test signal supplied from the test signal supply circuit.

REFERENCES:
patent: 4812677 (1989-03-01), Perry
patent: 4882506 (1989-11-01), Johansson et al.
patent: 4907230 (1990-03-01), Heller et al.
patent: 5095226 (1992-03-01), Tani

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