Measuring and testing – Gas analysis – Moisture content or vapor pressure
Patent
1977-03-11
1978-06-20
Ruehl, Charles A.
Measuring and testing
Gas analysis
Moisture content or vapor pressure
324222, 324225, G01K 736, G01R 3312
Patent
active
040954692
ABSTRACT:
An apparatus for measuring the temperature of a metallic body in a non-contact maner includes an electronic circuitry for measuring a change in the impedance of a detecting coil arranged oppposite to the metallic body. The electronic circuitry comprises an operational amplifier, a negative feedback circuit with adjustable feedback factor, a positive feedback circuit, an oscillator, a phase shifter circuit and a synchronous detection circuit. The change in the impedance of the detecting coil is caused by the effect of eddy current produced by the application of alternating field to the metallic body, and this impedance change is dependent on change in the temperature of the metallic body. By adjusting the negative feedback factor .beta..sub.N of the negative feedback circuit and the phase angle .theta. of the phase shifter circuit in the electronic circuitry, the relationship between the distance measured between the detecting coil and the metallic body and the measured output level, the temperature measuring sensitivity relative to the temperature of the metallic body and the temperature measuring sensitivity relative to the measuring distance can be determined as desired.
REFERENCES:
patent: 3164993 (1965-01-01), Schmidt
patent: 3281667 (1966-10-01), Dobbins et al.
patent: 3358225 (1967-12-01), Peugeot
patent: 3936734 (1976-02-01), Brandli et al.
patent: 3995211 (1976-11-01), Yamada et al.
Ando Seigo
Kameyama Akira
Watanabe Katsujiro
Yamada Takeo
Nippon Kokan Kabushiki Kaisha
Ruehl Charles A.
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