Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering
Patent
1977-12-30
1978-12-26
Mack, John H.
Chemistry: electrical and wave energy
Apparatus
Coating, forming or etching by sputtering
204192D, C23C 1500
Patent
active
041315332
ABSTRACT:
Isolating the anode shield of RF sputtering apparatus from the ground potential reduces the grounded surfaces to which the plasma is exposed and thereby increases the impedance between the plasma and the grounded surfaces. This improvement increases the resputtering rate significantly before the operating point of instability in the system is reached.
REFERENCES:
patent: 3617459 (1971-11-01), Logan
patent: 3743587 (1973-07-01), Kennedy
patent: 3755123 (1973-08-01), Davidse et al.
patent: 3763031 (1973-10-01), Scow et al.
patent: 3860507 (1975-01-01), Vossen, Jr.
R. P. Auyang et al., "Power Network for Substrate," IBM Tech. Disc. Bull., vol. 14, p. 1032 (1971).
J. S. Logan, "Control of RF Sputtered Film Properties Through Substrate Tuning," IBM J. Res. Dev., pp. 172-175 (1970).
Bialko Joseph A.
Lechaton John S.
Galvin Thomas F.
International Business Machines - Corporation
Mack John H.
Weisstuch Aaron
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