Apparatus and method for determination of residual stress in cry

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250272, 250273, G01N 2320

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active

040951030

ABSTRACT:
Apparatus and method for determination of residual stress in crystalline substances. An X-ray source is focused at two different, preselected angles with respect to a surface of a substance, and X-ray diffraction peaks are located with a single position-sensitive X-ray detector. The apparatus has positioning probes affixed to a base for maintaining the base in fixed relationship with the substance, and an arcuate glide channel formed in the base for controlled angular shifting of the X-ray source and detector. Residual stresses are determined more quickly than with prior art methods and apparatus having comparable precision because only a single detector is used, and because the detector locates diffraction peaks without time-consuming diffractometer shifting.

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