Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Patent
1996-07-11
1998-04-07
Chapman, Mark
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
430311, G03F 900
Patent
active
057362777
ABSTRACT:
Pattern data of a phase shift mask can be inspected: (101) by separating and laying out pattern data of a phase shift mask in an actual pattern data layer, an auxiliary pattern data layer and a phase shift pattern data layer; (102) by inspecting and correcting only the data of the actual pattern of the actual pattern data layer; (103) by making data of an estimated pattern estimated to be transferred to a semiconductor wafer from the data of the synthetic data of the correct actual pattern data, the auxiliary pattern data and the phase shift pattern data, which are inspected and corrected; and (104) by comparing the estimated pattern data and the actual pattern data to inspect the data of the auxiliary pattern and the phase shift pattern.
REFERENCES:
patent: 5045417 (1991-09-01), Okamoto
patent: 5458998 (1995-10-01), Takekuma et al.
A.R. Neureuther; "Modeling Phase Shifting Masks;" BACUS Symposium Paper; Sep. 26, 1990.
Hirai, et al. "Extended Absracts", 38th Spring Mtg. 1991, The Japan Society of Applied Physics and Related Societies.
Maber, et al. Publishey: Katsuhisa Morita, Tokyo "Introduction to MOS LSI Design", pp. 212-214; Apr., 1984.
Morisue, "LSI Design & Fabrication Technique"; Sep., 1987, Tokyo pp. 162-167.
Ong. "Modern MOS Technology: Processes, Devices and Designs", pp. 317-331, 1986, New York.
Ishihara Masamichi
Iwai Hidetoshi
Suzuki Toshio
Takekuma Toshitsugu
Chapman Mark
Hitachi , Ltd.
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