Method and circuit structure for measuring and testing discrete

Details Method and circuit structure for measuring and testing discrete Method and circuit structure for measuring and testing discrete

1994-07-05

1997-08-19

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324537, 3241581, G01R 3102

Patent

active

056592574

ABSTRACT:
A structure for measuring and testing discrete components interconnected with one or more integrated circuits on a mixed-signal circuit board. Each integrated circuit includes a test cell comprising a plurality of switches connected with a single on-chip bus which is in turn connected with a single circuit board bus. The structure permits a constant current to be supplied to the components over the single bus and voltage measurements to be made to determine the component values with a lower overhead in pins and board area.

REFERENCES:
patent: 4922492 (1990-05-01), Fasang et al.
patent: 5210486 (1993-05-01), Wilson et al.
patent: 5225834 (1993-07-01), Imai et al.
IC Master 1980, United Technical Publications, Inc., 645 Stewart Ave., Garden City, NY 11530; Intersil Integrated.
Circuit (ICL 8052/ICL 7104), manufactured by Intersil, Inc., 10710 N. Tanau Ave, Cupertino, CA 95014, ref. pp. 786-800.

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