Method of evaluating signal conditions in a probe measurement ne

Details Method of evaluating signal conditions in a probe measurement ne Method of evaluating signal conditions in a probe measurement ne

1996-06-26

1997-08-19

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 731, G01R 3102

Patent

active

056592558

ABSTRACT:
A method of evaluating the signal conditions in a probe measurement network of the type having a plurality of separate measurement channels, where each channel communicates through a corresponding device-probing end. The method includes providing an assembly which includes a conductive planar probing area on the upper face of a base and a reference junction connected to the probing area by a high-frequency transmission structure. The method further includes placing the respective device-probing end of a first one of the measurement channels into contact with the planar probing area, transmitting a high-frequency signal through both the measurement channel and the reference junction and, thereafter, measuring the signal. This step is repeated for the other measurement channels and the signal conditions in the different channels are then evaluated by comparing the measured signals, where such evaluation is facilitated by maintaining, via the high-frequency transmission structure, a transmission line of substantially constant high-frequency transmission characteristic between each device-probing end coming into contact with the planar probing area and the reference junction.

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"Checkpoint.TM.", product literature sheets (2 pages) for a probe card analyzer made by Applied Precision of Mercer Island, Washington (undated but prior to Apr. 14, 1995).
"Probilt PB500A.TM. Probe Card Repair and Analysis Station," product brochure (4 pages) for a probe card analyzer made by Integrated Technology Corporation of Tempe, Arizona (undated but prior to Apr. 14, 1995).

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