Locating the position of an event in acquired digital data at su

Details Locating the position of an event in acquired digital data at su Locating the position of an event in acquired digital data at su

1993-05-21

1994-11-15

McGraw, Vincent P.

Optics: measuring and testing

For optical fiber or waveguide inspection

G01N 2188

Patent

active

053653289

ABSTRACT:
A method for characterizing an event in acquired digital data is described where the event has a known shape and a pattern having amplitude and location coefficients is applied to the data for determining a best fit between the data and the pattern as a function of a peak RMS value. The derived RMS value is compared to a threshold value for verifying the existence of the event. The event is characterized as to amplitude and location using the amplitude and location coefficients of the pattern. Such a method is useful in characterizing non-reflective events in acquired optical time domain reflectometry data.

REFERENCES:
patent: 4898463 (1990-02-01), Sakamoto et al.
patent: 5069544 (1991-12-01), Buerli
patent: 5155439 (1992-10-01), Holmbo et al.

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