Method and apparatus for increasing the durability and yield of

Details Method and apparatus for increasing the durability and yield of Method and apparatus for increasing the durability and yield of

1985-12-05

1987-02-03

Weisstuch, Aaron

Metal working

Method of mechanical manufacture

Assembling or joining

29572, 29575, 29584, 136290, 324158D, 356237, H01L 3118

Patent

active

046400028

ABSTRACT:
Thin film photovoltaic cells having a pair of semiconductor layers between an opaque and a transparent electrical contact are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device.

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