Process for cleaning the interior of semiconductor substrate

Cleaning and liquid contact with solids – Processes – For metallic – siliceous – or calcareous basework – including...

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C03C 2300

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active

060598875

ABSTRACT:
A process of cleaning the interior of a semiconductor substrate containing metallic impurities therein is provided. The semiconductor substrate is heated, with one side or the both sides thereof being in contact with a melt of a metal or an inorganic salt, at a high temperature such that the melt does not react with these semiconductor and the semiconductor is not melted. By this process, the impurities present inside the substrate are removed out of the substrate and the interior thereof is cleaned.

REFERENCES:
patent: 3650823 (1972-03-01), Mead et al.
patent: 3993533 (1976-11-01), Milnes et al.
patent: 4078942 (1978-03-01), Luisi et al.
patent: 4094731 (1978-06-01), Keyser et al.
patent: 4284428 (1981-08-01), Canning, Jr.
patent: 4288246 (1981-09-01), Banski et al.
patent: 4612179 (1986-09-01), Sanjurjo et al.
patent: 4645546 (1987-02-01), Matsushita
patent: 4769058 (1988-09-01), McMaster
patent: 4828814 (1989-05-01), Sanjurjo et al.
patent: 5015509 (1991-05-01), Rey
patent: 5066359 (1991-11-01), Chiou
patent: 5089082 (1992-02-01), Dreier et al.
patent: 5141563 (1992-08-01), Colon et al.
patent: 5377398 (1995-01-01), Bessey
patent: 5505786 (1996-04-01), Cole et al.

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