Cleaning and liquid contact with solids – Processes – For metallic – siliceous – or calcareous basework – including...
Patent
1998-04-03
2000-05-09
Gulakowski, Randy
Cleaning and liquid contact with solids
Processes
For metallic, siliceous, or calcareous basework, including...
C03C 2300
Patent
active
060598875
ABSTRACT:
A process of cleaning the interior of a semiconductor substrate containing metallic impurities therein is provided. The semiconductor substrate is heated, with one side or the both sides thereof being in contact with a melt of a metal or an inorganic salt, at a high temperature such that the melt does not react with these semiconductor and the semiconductor is not melted. By this process, the impurities present inside the substrate are removed out of the substrate and the interior thereof is cleaned.
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Kobayashi Norio
Muraoka Hisashi
Nadahara Soichi
Tomita Hiroshi
Gulakowski Randy
Kabushiki Kaisha Toshiba
Purex Co., Ltd.
Toshiba Ceramics Co. Ltd.
Wilkins Yolanda E.
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