Method and device for monitoring the thickness of continuously c

Geometrical instruments – Distance measuring – Opposed contacts

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Details

271262, 27126504, G01B 506, G01B 504, B65H 514

Patent

active

061193585

ABSTRACT:
A device and method for monitoring the thickness of printed products which are conveyed by one conveying means each in a continuous conveying stream along a conveying direction. Monitoring elements are introduced into the conveying stream and one monitoring element is allocated to each printed product. The monitoring elements include a pair of monitoring levers with clamping jaws which are pressed against each other with a clamping force. During monitoring, a region of each printed product is clamped between the clamping jaws of a pair of levers which are pressed against each other. Pairs of one monitoring element and one printed product interact with each other and are conveyed in succession through a monitoring area. For quantitative recording of this interaction, an image is recorded of one edge of each of the monitoring levers of one lever pair, and of the distance between these edges. The distance is a function of the thickness of the pressed printed product. From this image, a measured value corresponding to the distance is determined. The measured value is compared with a reference range allocated to each monitoring element. The reference range is determined according to reference value determined by calibration, and a predetermined tolerance range, whereby a calibration is carried out for each control element using a product with a known, correct thickness.

REFERENCES:
patent: 4279079 (1981-07-01), Gamberini et al.
patent: 4473951 (1984-10-01), Golinelli et al.
patent: 4493153 (1985-01-01), Esken
patent: 4549207 (1985-10-01), Boshier
patent: 4697246 (1987-09-01), Zemke et al.
patent: 4710808 (1987-12-01), Hoogenboom et al.
patent: 4941269 (1990-07-01), Mori et al.
patent: 5447240 (1995-09-01), Makino
patent: 5568917 (1996-10-01), Buschhaus et al.
patent: 5647588 (1997-07-01), Stauber et al.
patent: 5649588 (1997-07-01), Lee

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