Method for realizing a primary photometric standard of optical r

Details Method for realizing a primary photometric standard of optical r Method for realizing a primary photometric standard of optical r

1990-06-21

1991-12-10

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

324158D, G01J 350, H01J 516, H01J 4014

Patent

active

050721127

ABSTRACT:
In a method for realizing a photometric standard of optical radiation based on an absolute responsivity for a photometric quantity, there are measured using a beam of light projected from a white light source through an optical filter for the spectral luminous efficacy correction onto a silicon photodiode, a surface reflectance of the silicon photodiode, a recombination loss in a rear region beyond a depletion layer thereof, and a recombination loss in the vicinity of a boundary region between an insulating layer and a silicon layer thereof, which are independent of the wavelength .lambda. of light. Thereafter, there is calculated an absolute responsivity [A/1m] for a photometric quantity [1m] of a photodetector composed of the silicon photodiode and the optical filter, from the measured surface reflectance of the silicon photodiode and the measured recombination losses thereof.

REFERENCES:
"Silicon Photodiode Absolute Spectral Response Self-Calibration Using a Filtered Tungsten Source," Carroll G. Hughes 111, Applied Optics, vol. 21, No. 12, Jun. 15, 1982, pp. 2129-2132.
"Induced Junction (Inversion Layer) Photodiode Self-Calibration"; Robert L. Booker and Jon Geist; Applied Optics, vol. 23, No. 12, Jun. 15, 1984, pp. 1940-1945.
"Sixth Comparison of National Standards of Luminious Intensity and of Luminous Flux (1985)", J. Bonhoure, Metrologia, vol. 24, 1987, pp. 157-162.
"Silicon Photodiode Absolute Spectral Response Self-Calibration" E. F. Zalewski et al., Applied Optics, vol. 19, No. 8, Apr. 15, 1980, pp. 1214-1216.

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