Precision X-ray diffraction system incorporating a laser aligner

Details Precision X-ray diffraction system incorporating a laser aligner Precision X-ray diffraction system incorporating a laser aligner

1976-03-01

1977-12-27

Buczinski, S. C.

Optics: measuring and testing

Angle measuring or angular axial alignment

With photodetection remote from measured angle

250272, 356 30, 356 31, G01B 1126, G01N 2100

Patent

active

040652114

ABSTRACT:
An X-ray diffraction system for crystal analysis employing laser alignment o reduce errors inherent in the mechanical operation of the goniometer apparatus.

REFERENCES:
patent: 3448265 (1969-06-01), Samuelson
patent: 3880524 (1975-04-01), Dill et al.
Greene et al., J. Phys. E. (Gr. Britain) vol. 5, No. 10, Oct. 1975.

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