Patent
1989-01-25
1991-11-12
Mintel, William
357 32, 357 58, 357 22, H01L 2714
Patent
active
050652060
ABSTRACT:
A semiconductor device comprises a semiconductive substrate of a low impurity concentration, a channel area of a low impurity concentration formed on the substrate, a source area formed on the channel area and having a high impurity concentration of a conductive type opposite to that of the substrate, a drain area formed on the channel area and having a high impurity concentration of a conductive type opposite to that of the substrate, and an accumulating gate area formed on the channel area and having a conductive type same as that of the substrate. The source area and drain area are arranged in a predetermined direction along the substrate. The accumulating gate area comprises a first part sandwiched between the source area and the drain area and extended in a direction crossing the predetermined direction and second and third parts connected with the first part and approximately extended in the predetermined direction. The accumulating gate area is adapted to accumulate a charge corresponding to the intensity of the incident radiation. A current flows from one to the other of the source area and the drain area through a part of the channel area sandwiched between the first part of the accumulating gate area and the substrate. The potential of the accumulating gate area varies according to the accumulated charge. The current varies according to the potential of the accumulating gate area.
REFERENCES:
patent: 3836993 (1974-09-01), Joshi
patent: 4249190 (1981-02-01), Cho
patent: 4504847 (1985-03-01), Nishizawa
patent: 4651180 (1987-03-01), Nishizawa et al.
patent: 4733286 (1988-03-01), Matsumoto
patent: 4952996 (1990-08-01), Nishizawa et al.
Maeda Hideo
Nishizawa Jun-ichi
Tamamushi Takashige
Mintel William
Nikon Corporation
Potter Roy
Zaidan Hojin Handotai Kenkyu Shinkokai
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