Semiconductor integrated circuit device testing

Details Semiconductor integrated circuit device testing Semiconductor integrated circuit device testing

1990-03-05

1991-11-12

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, G01A 3102

Patent

active

050650912

ABSTRACT:
A substrate voltage generating circuit is provided on a semiconductor substrate, and the substrate voltage generating circuit generates a voltage to be applied to the semiconductor substrate. A value of the voltage generated by the substrate voltage generating circuit is changed corresponding to a switching of an operational mode of a semiconductor integrated circuit device from a normal mode to a test mode. Thus, operational characteristics of the semiconductor integrated circuit device in a test mode is changed, so that defective products can be detected in a simple short time test.

REFERENCES:
patent: 3969706 (1976-07-01), Proebsting et al.
patent: 4455628 (1984-06-01), Ozaki et al.
patent: 4513399 (1985-04-01), Tobita
patent: 4654849 (1987-03-01), White, Jr. et al.
patent: 4725985 (1988-02-01), Ogura et al.
patent: 4837505 (1989-06-01), Mitsunobu
patent: 4841233 (1989-06-01), Yoshida
McAdams et al., "A 1-Mbit CMOS Dynamic RAM With Design-For Test Functions," IEEE Journal of Solid-State Circuits, vol. SC-21, No. 5, Oct. 1986, pp. 635-642.

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