Image analysis – Pattern recognition – Feature extraction
Patent
1995-07-25
2000-04-25
Boudreau, Leo H.
Image analysis
Pattern recognition
Feature extraction
382103, 382192, 382194, 382201, G06K 900, G06K 946, G06K 966
Patent
active
060553340
ABSTRACT:
An image and method for determining the location of known pattern of data in a captured object image wherein a feature analysis is performed upon a representative plurality of pixel locations to determine a starting point, feature analysis is performed upon the pixel locations surrounding the starting point and the starting point is moved to another pixel location if provides a higher feature analysis value than the starting point; the process of performing feature analyses and moving the starting point continues until the starting point is moved a maximum feature analysis value; once the maximum feature analysis value is found, the object image data may be rotated incrementally with respect to the reference pattern data and the feature analysis/starting point selection process repeated for each iteration until an object image location and object angle of rotation is determined.
REFERENCES:
patent: 4326190 (1982-04-01), Borland et al.
patent: 4493105 (1985-01-01), Beall et al.
patent: 5333248 (1994-07-01), Christensen
patent: 5555555 (1996-09-01), Sato et al.
Boudreau Leo H.
Mariam Daniel G.
Omron Corporation
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