Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1995-04-27
1997-06-03
Gonzalez, Frank
Optics: measuring and testing
By particle light scattering
With photocell detection
356359, 385 85, G01B 902
Patent
active
056360207
ABSTRACT:
A zone analysis system and method (211) optimize speed and minimize adverse effects resulting from noise in an inspection system (90) for measuring disparity between two surfaces. In particular, the zone analysis system and method (211) can be implemented in an inspection system (90) for contactlessly measuring undercut or protrusion of an optical fiber (26) relative to a surrounding support material (36) at the endface (79) of an optical fiber termination (37). In structure, the inspection system (90) has a measurement apparatus (91) with an interferometer (98) controlled by a machine vision system (92) for determining the degree of disparity. The inspection system (90) measures an offset of an interferometric fringe (113') produced by the interferometer (98) over the target (82) in the image in order to determine the disparity. Further, the machine vision system (92) employs the zone analysis system and method (211) for optimizing the performance thereof.
REFERENCES:
patent: 4738507 (1988-04-01), Palmquist
patent: 4738508 (1988-04-01), Palmquist
patent: 4787698 (1988-11-01), Lyons et al.
"Checkmate F5 System Instruction Manual," Oyokoden Lab Co., Ltd. (1991) no month.
"Norland Fiber Interferometer," Norland Products Inc., New Brunswick, NJ (1992).
"ZX-1 Zoom Interferometers," Direct Optical Research Company, Phoenix, AZ (Jan. 1995).
"TOPO-3D Quick Tour Manual," Wyko Corporation, Tucson, AZ., Ltd. (Feb. 1990).
Csipkes Andrei
Palmquist John M.
Gonzalez Frank
Kim Robert
Lucent Technologies - Inc.
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