Zig zag scanning densitometer with base line and impurity correc

Details Zig zag scanning densitometer with base line and impurity correc Zig zag scanning densitometer with base line and impurity correc

1977-08-29

1979-03-20

Corbin, John K.

Optics: measuring and testing

For optical fiber or waveguide inspection

356444, G01N 2122

Patent

active

041451392

ABSTRACT:
Densitometer for quantitative determination of a sample spot on a thin-layer chromatography (TLC) plate or the like having besides the spot an area of impurities developed thereon, wherein the surface of the plate is scanned in a zigzag way by a light beam having a minute cross section. In one stroke of the zigzag scanning of the area containing impurities immediately before the spot the measured signal is integrated and stored by a first integrator and in each and every one of the succeeding strokes of the scanning of the spot the measured signal is integrated by a second integrator. The stored integrated value of the first integrator is subtracted from the integrated value of the second integrator in each and every one of the scanning strokes across the spot and the result of the subtraction is integrated for quantitative determination of the spot without errors caused by the impurities contained in the sample.

REFERENCES:
patent: 3994587 (1976-11-01), Yamamoto et al.
patent: 4013364 (1977-03-01), Nakano et al.

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