Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2006-12-19
2006-12-19
Verbitsky, Gail (Department: 2859)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C327S512000
Reexamination Certificate
active
07150561
ABSTRACT:
A method and circuit for reducing a temperature dependent error in p-n junction based temperature measurements. The temperature-dependent error may be caused by parasitic resistance in a p-n junction and temperature dependent variation of a bias current in a temperature sensor. A difference in base-emitter voltage of a sensing transistor is employed to determine a temperature of a source device. In one embodiment, a zero Temperature Coefficient (TC) current source employing a temperature dependent variation of a current generates by an emitter-base voltage across a resistor between the emitter and the base of a junction transistor is used to counter balance a Proportional To Absolute Temperature (PTAT) current source.
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Aslan Mehmet
D'Aquino Dan
Darby & Darby P.C.
Gaffney Matthew M.
Jagan Mirellys
National Semiconductor Corporation
Verbitsky Gail
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